Site Map

Exhibitions


HET Instrument 2010

HET Instrument is the biggest technology exhibition in the Benelux. This year, it will be taken place at Amsterdam RAI from Tuesday 28 September through 1 October 2010.
There will be 450 exhibitors who represent companies in the various branches: industrial electronics, industrial automation and laboratory technology.

 

Micro-optik (a busines unit of Flokal BV) would like to invite you to come and visit our booth at Het Instrument: Booth C075, Hall 1, Amsterdam RAI. For advance registration, please click here.

Our specialists will be very pleased to meet you and present our new line of products. We appreciate all the interesting and inspiring discussions about your applications and how our products might fit to help you out.

Over here, you will also have chance to experience our newest technology with respect to applied digital video microscopy and machine vision inspection systems.

DiMiC™ 3D xyz topography scanner A true novelty is our DiMiC™ 3D xyz topography scanner.
The instrument is capable to scan an entire wafer, object or electronical product and generates a 3D structure with very high accuracy. The technique is based on Flokal’s proprietary hybrid laser DFD technology. Our developers have taken Depth From Defocus technology to the next level of sophistication.
3D rotation head inspection system

Another novelty is our 3D rotation head inspection system. With this video microscope we can inspect all kinds of material and objects from various angles with a 360° rotation. The images are superb in quality and can be used for any object. Ideal for quality control in electronical and plastic production.

Smart-eye™ products

Also we are proud to introduce our new line of Smart-eye™ products. These are compact mini-camera’s which can be used for many different quality inspection purposes.


These and other technologies will be displayed.

Top-Eye™ Digital Microscope for topography analysis Micro-Eye™ Digital Microscope Quality Inspection Platform
DIMIC™ LT Laser Topography Digital Video Microscope Smart-Eye™ Wireless Microscope

Our team of experts are at your service
to discuss your application to see whether we can find a solution.


Date:

September 28 - October 1, 2010

Place:

Hall 1, booth C075
Amsterdam RAI (click to see the map)
Europaplein 22
NL 1078 GZ
Amsterdam
Netherlands

Subject of
exhibition:

Industrial Electronics; Industrial Automation and Laboratory Technology


HET Instrument: the biggest technology exhibition in the Benelux


Registration

HET Instrument 2010 offers the exhibiting companies the possibility to present their innovations, products and services while allowing broad professional public to gain comprehensive information about the trends in medical and laboratory equipment, pharmaceutics and optics.

 

The profile of HET Instrument 2010:

  • Analytic Instrumens
  • Optical Instruments
  • Biotechnology & Instruments
  • Laboratory Instruments & Equipment
  • Test & Quality Control
  • ...and other related products
click here to visit HET Instrument 2010 site

If you can't visit us on HET Instrument 2010 please don't hesitate to contact us or please look for our both on other coming exhibitions!


.: Bilogical Microscopes :. 

.: Stereo Microscopes :. 

.: KH :. 

.: DiMic :. 

.: DiMic Ultra zoom :. 

.: DiMic Topography :. 

.: Far-Eye :. 

.: High-Speed 3D Camera :. 

.: Micro-Eye :. 

.: Smart-Eye :. 

.: X-Loupe :. 

.: Dino-Lite :. 

.: Automation and Image Analysis :. 

.: Stand and Accesories :. 

.: Tailored software solutions :. 

.: Heating and Cooling Stages :. 

.: Solar Cell Inspection System :. 

.: Inspection and Analysis :. 

.: Advertisement Videos :. 

.: Engineering Services :. 

.: Scanning Electron Microscopy :. 

.: MIMAS :. 

.: Low Voltage Electron Microscopy :. 

.: NIR Industrial Spectrometers :. 



For any information, demonstration, tests or quotation, please send an email to: info@micro-optik.com

© 2010 Micro-optik